Selim Sermet Akbay - Publications

In this section you will find my related publications. Already published ones are listed below together with their pre-release PDF versions. You can email me to get a worksheet that updates pre-release versions to final published ones. Some of them, especially workshop papers, are not public domain, so this is the only place you can get them. I have also provided BibTex listings for them in case you need a shortcut for reference purposes. At the very bottom, you can find a list of working papers. If you would like to collaborate, please email me.

List of Selected Publications

Journal	S.S. Akbay, A. Halder, A. Chatterjee, D. Keezer,
	"Low Cost Test of Embedded RF/Analog/Mixed-Signal Circuits in SOPs,"	(pdf)
	IEEE Trans. on Advanced Packaging, vol. 27, iss. 2, pp. 352-363, May 2004.

	R. Voorakaranam, S. Cherubal, S.S. Akbay, A. Chatterjee,	in prog.
	"Signature Testing of Analog and RF Circuits: Algorithms and Methodology,"
	submitted to IEEE Transactions on Circuits and Systems.

Conf.	S.S. Akbay, J. L. Torres, J. M. Rumer, A. Chatterjee, J. Amtsfield,
	"Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and Validation,"	(pdf)
	Proc. International Test Conference, Santa Clara, CA, USA, Oct. 2006.

	S.S. Akbay, A. Chatterjee,
	"Built-In Test of RF Components Using Mapped Feature Extraction Sensors,"	(pdf)
	Proc. 23rd IEEE VLSI Test Symposium, Palm Springs, CA, USA, May 2005.

	S.S. Akbay, A. Chatterjee,
	"Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference,"	(pdf)
	Proc. 22nd IEEE VLSI Test Symposium, Napa Valley, CA, USA, April 2004, pp. 273-278.

	D. Han, S.S. Akbay, S. Bhattacharya, A. Chatterjee, W.R. Eisenstadt,
	"On-Chip Self Calibration of RF Circuits Using Specification-Driven Built-In Self Test,"	(pdf)
	Proc. 11th IEEE International Online Testing Symposium, July 2005, pp. 106-111.

	S.S. Akbay, J. L. Torres,
	"Alternate Test, A New Method for Specification Testing of RF Devices: A Proof of Concept,"	(pdf)
	Intel Design and Test Technology Conference (DTTC), August 2006.

Worksh.	S.S. Akbay, A. Chatterjee,
	"Comprehensive Catastrophic and Parametric Fault Testing Using the Alternate Test Approach,"	(pdf)
	Proc. IEEE Int. Workshop on Current & Defect Based Testing (DBT), Santa Clara, CA, USA, October 2006, pp. 45-50.

	S.S. Akbay, A. Chatterjee,
	"Temperature Compensated Built-In Alternate Test of RF Modules,"	(pdf)
	Digest of 1st IEEE International GHz/Gbps Test Workshop, Charlotte, NC, USA, October 2004.

	S.S. Akbay, A. Chatterjee,
	"Alternate Test of RF Mixers by Current Signatures,"	(pdf)
	Digest of 3rd Workshop on Test of Wireless Circuits and Systems, International Microwave Symposium, Fort Worth, TX, USA, June 2004.

	S.S. Akbay, A. Chatterjee,
	"Optimal Multisine Tests for RF Amplifiers,"	(pdf)
	Digest of 2nd IEEE Workshop on Test of Wireless Circuits and Systems, Baltimore, MD, USA, October 2002.

Other	S.S. Akbay, S. Bhattacharya, D. Keezer, A. Chatterjee,
	Electrical Test of System on Package Technologies	(pdf)
	Book chapter 13 in "Introduction to System on Package", McGraw-Hill, to be published in 2007.

	D. Han, S.S. Akbay, A. Chatterjee, S. Bhattacharya,
	"On-Chip Self-Calibration Method of RF Circuits using Built-In Self-Test,"	(pdf)
	Patent Application #60/694,388; filed June 2005.

	S.S. Akbay, A. Chatterjee,
	"Fault Modeling and Testing of Analog/RF Circuits,"	(pdf)
	Technical Report, School of Electrical and Computer Engineering, Georgia Inst. of Tech., Mar. 2003.

List in Plain Text and BibTex

Click this link to get a plain text version of the above listing as well as BibTex entries. It also includes abstracts.

Old Publications

Following is a list of publications related to my undergrad research in Middle East Technical University, MEMS/VLSI Group under the supervision of Prof. Tayfun Akin. The text version together with BibTex is available here.

METU MEMS	S.S. Akbay, A. Bircan, T. Akin,
	"A CMOS Visible Image Sensor Array Using Current Mirroring Integration Readout Circuitry,"	(pdf)
	Proceedings of Eurosensors XIX, Sept. 2000.

	H. Kulah, T. Akin,
	"A Current Mirroring Integration Based Readout Circuit for High Performance Infrared FPA Applications,"	(pdf)
	IEEE Trans. on Circuits and Systems II: Analog and Digital Sig. Proc., v 50, n 4, April 2003, p 181-6.

	S.S. Akbay, T. Akin,
	"Current Mirroring Integration Focal Plane Arrays for Infrared Imagers,"	(pdf)
	Technical Report, Electrical and Electronics Engineering Department, Middle East Technical University, June 2000.

Working Papers

The following is a list of the papers I have been working on. It is last updated on December 2006.

Built-In Test of RF Components using Spectral and Temporal Feature Extractors (%85 complete)
Test Stimulus Generation for RF Systems with IP Constraints (%85 complete)
Fault-Based Testing of RF Components using Alternate Test (%75 complete)
Process Diagnostics using Alternate Test of RF Systems (%50 complete)
A Benchmark Framework for Validation of Alternate Test on RF Circuits (%35 complete)